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IC Measurement Service Statistics
The CIC has a full range of measurement services, including those for digital, analog, Mixed-Signal, RF, and MEMS. Specifically, On-Wafer Probe Station, RF IC measurement system Load-Pull measurement system, high frequency S-parameter, noise figure measurement system, signal source analyzer and wireless communication measurement system were also available. Figure 42 presents service statistics. In 2007, academia used this testing equipment on 1028 occasions. Notably, 159 of these cases involved use of the Agilent 93000 SoC Test System.
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